High-Speed Digital Test Techniques
Course Outlines
Please click on the titles below to access the detailed contents of each class:


When Digital Becomes Analog - Interfaces in High Speed Test (1 day)

High-Speed Digital Test Techniques (3 - 4 days)



Digital Timing Measurements - From Scopes and Probes to Timing and Jitter (1 day)

Digital Timing Measurements - From Scopes and Probes to Timing and Jitter (2 days)



Analyzing, Modeling and Understanding High-Speed Interfaces Using Time Domain
Reflectometry (1 day)


All classes can be customized to the specific audience and the specific event, and the
presentation material is constantly updated and improved - to a considerable extent based on
the participants' feedback. As a result the outlines above should only be taken as an
approximate guideline for the topics that are covered. E.g. if participants are specifically
interested in ultra-high-speed, multi-GHz benchtop measurements, the actual presentation
will look very different compared to one for people mostly concerned with large-scale
production test issues.

As a general rule, the more time is allowed for a presentation, the higher the interactivity and
the larger the benefit for the participants. The extended (2-day and 3-day) classes allow for a
good dose of real-time simulation, demonstrations, as well as on-the-spot problem
discussions in response to questions from the audience. Over the course of recent seminars
several design and test related problems got solved directly during the class or in the breaks
between the lectures!