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High-Speed Digital Test Techniques
| Upcoming Classes |
 | “Digital Timing Measurements - From Scopes and Probes to | |
| Timing and Jitter” |
TTEP tutorial, Sun., Oct. 31 or Mon., Nov 1, 2010 (tbd.)
Organizer: TTEP / ITC International Test Conference 2008
Location: Austin Convention Center, Austin, Texas, USA
Conference Webpage: http://www.itctestweek.org/
| “Analyzing, Modeling and UnderstandingHigh Speed Interfaces | |
| Using Time Domain Reflectometry” |
Invited Tutorial, Nov. 9, 2010
Organizer: Silicon Valley Test Conference
Location: San Jose, California, USA
Conference Webpage: http://www.svtest.com/
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