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High-Speed Digital Test Techniques
| About the Presenter |
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Dipl.Ing. Dr. Wolfgang Maichen is currently the lead engineer of the ASIC characterization
department for Teradyne, Inc. in Agoura Hills, California. His work centers on high-precision,
high-speed electrical measurement techniques, signal fidelity, bench-top IC characterization of
leading-edge digital, analog and mixed signal ASICs, PCB design, and board-level circuit
design. He frequently holds tutorials about high-speed test issues for internal as well as
external audiences. Prior to this position, he worked as an applications engineer for
high-speed memory and VLSI test at the same location.
Before joining Teradyne, Mr. Maichen worked as a product engineer for Siemens
Semiconductor (now Infineon) in France, performing electrical failure analysis, reliability
studies, and bench-top semiconductor device characterization.
Mr. Maichen holds a Masters degree in Applied Physics and a Ph.D. in the same subject from
the University of Technology in Graz, Austria. His Ph.D. thesis dealt with experiments in the
field of quantum optics and atomic spectroscopy.
He is the author of a book titled "Digital Timing Measurements" (Springer, 2006, ISBN
0-387-31418-0) and co-author of "Advances in Electronic Testing" (editor: Dimitris Gizopoulos,
Springer, 2006, ISBN 0-387-29408-2). He has published several papers in international
peer-reviewed journals and has given presentations and tutorials at international conferences.
Being fluent in German, English and French enables him to further customize his
presentations to the specific background of the audience.
department for Teradyne, Inc. in Agoura Hills, California. His work centers on high-precision,
high-speed electrical measurement techniques, signal fidelity, bench-top IC characterization of
leading-edge digital, analog and mixed signal ASICs, PCB design, and board-level circuit
design. He frequently holds tutorials about high-speed test issues for internal as well as
external audiences. Prior to this position, he worked as an applications engineer for
high-speed memory and VLSI test at the same location.
Before joining Teradyne, Mr. Maichen worked as a product engineer for Siemens
Semiconductor (now Infineon) in France, performing electrical failure analysis, reliability
studies, and bench-top semiconductor device characterization.
Mr. Maichen holds a Masters degree in Applied Physics and a Ph.D. in the same subject from
the University of Technology in Graz, Austria. His Ph.D. thesis dealt with experiments in the
field of quantum optics and atomic spectroscopy.
He is the author of a book titled "Digital Timing Measurements" (Springer, 2006, ISBN
0-387-31418-0) and co-author of "Advances in Electronic Testing" (editor: Dimitris Gizopoulos,
Springer, 2006, ISBN 0-387-29408-2). He has published several papers in international
peer-reviewed journals and has given presentations and tutorials at international conferences.
Being fluent in German, English and French enables him to further customize his
presentations to the specific background of the audience.